Length distribution of single walled carbon nanotubes determined by ac atomic force microscopy

摘要

A simple method to disperse individual single walled carbon nanotubes (SWCNT) on an atomically flat substrate is presented. Proper tuning of ac modes ofatomic force microscopes(AFM) is discussed. This is needed to discriminatebetween individual nanotubes and very small bundles. The distribution oflengths of the nanotubes measured by these methods is reported.